Glossary and Abbreviations
- Absorption edge
- Rapid increase in absorption with increasing energy
- AEY
- Auger electron yield
- APD
- Avalanche photodiode
- Auger process
- Relaxation of a core‐hole via electron emission
- CCD
- Charge‐coupled device
- CEE
- Constant emission energy
- CIE
- Constant incident energy
- Compton scattering
- Inelastic scattering
- Debye‐Waller
- Factor describing disorder in interatomic distances
- DFT
- Density functional theory
- EDE
- Energy dispersive EXAFS
- EDX
- Energy dispersive x‐ray spectroscopy
- EXAFS
- Extended x‐ray absorption fine structure
- FEL
- Free electron laser
- FT
- Fourier transform
- FY
- Fluorescence yield
- FZL
- Fresnel zone plate
- HARPES
- Hard x‐ray photoelectron spectroscopy
- HERFD
- High‐energy resolution fluorescence detection
- IV
- In vacuum
- KB
- Kirkpatrick‐Baez (mirrors)
- MLL
- Multilayer Laue lens
- NEXAFS
- Near‐edge x‐ray fine structure
- NIXS
- Nonresonant Inelastic x‐ray Scattering
- OD
- Optically detected
- PCA
- Principal component analysis
- QEXAFS
- Quick extended x‐ray absorption fine structure
- Rayleigh scattering
- Elastic scattering
- REXS
- Resonant x‐ray Emission Spectroscopy
- RIXS
- Resonant Inelastic x‐ray scattering or spectroscopy
- SR
- Synchrotron radiation
- STXM
- Scanning transmission x‐ray microscopy
- TEY
- Total electron yield
- TXM
- Transmission x‐ray microscopy
- VtC
- Valence to core
- X‐PEEM
- X‐ray photoelectron emission microscopy
- XAFS
- X‐ray absorption fine structure
- XANES
- X‐ray absorption near‐edge structure
- XAS
- X‐ray absorption spectroscopy
- XEOL
- X‐ray excited optical luminescence
- XES
- X‐ray emission spectroscopy
- XFEL
- X‐ray free electron laser
- XMCD
- X‐ray magnetic circular dichroism
- XMLD
- X‐ray magnetic linear dichroism
- XRS
- (Inelastic) X‐ray Raman Scattering