a
- absorption coefficients
- absorption contrast imaging
- absorption edges
- edge jump
- and atomic number
- and fluorescence yield
- edge position
- electron configurations
- and electron shell
- maximum slope
- Advanced Light Source (ALS)
- Advanced Photon Source (APS)
- AEY (Auger electron yield)
- air, x‐ray transmission through
- ALS (Advanced Light Source)
- analyzer crystals
- antiferromagnetic materials
- APDs (avalanche photodiodes)
- APS (Advanced Photon Source)
- argon, ion chamber gas
- ARTEMIS (software)
- ATHENA (software)
- atomic number
- and absorption coefficients
- and attenuation lengths
- and edge position
- fluorescence yield as function of
- attenuation lengths
- air as a function of energy
- and atomic number
- fluorescence detection
- germanium and iridium
- and sample thickness
- Auger electron emission
- Auger electron yield (AEY)
- avalanche photodiodes (APDs)
b
- background subtraction
- back scattering
- beamline architecture
- angular divergence
- combined techniques
- energy resolution
- EXAFS
- fluorescence detection
- mirrors
- monochromators see monochromators
- near‐sample focusing elements
- Kirkpatrick‐Baez (KB) mirrors
- x‐ray lenses
- zone plates
- pre‐monochromator slits
- STXM
- third generation
- two‐color XAFS
- TXM
- XEOL
- biological samples
- earthworm excretions
- mammalian cell
- marine magnetotactic bacteria
- Bragg angles and photon energies
- Bragg monochromators
- Bragg’s equation
- brehmsstrahlung
- bromine
c
- calcium
- carbon
- case studies
- chemical processing
- liquid phase reactions
- reactions of solid‐state materials
- functional materials
- natural, environmental, and heritage materials
- catalytic reactions
- CEE (constant emission energy)
- cell design
- CEY (conversion electron yield) detection
- charge coupled device (CCD) cameras
- chemical processing
- liquid phase reactions
- fast reactions
- steady state or slow reactions
- ultrafast reactions
- very fast reactions
- reactions of solid‐state materials
- fast reactions
- steady‐state or slow reactions
- chromium
- absorption edges
- catalyst
- crystal analyzers
- energies of edges and emissions
- vacant states
- CIE (constant incident energy)
- CIY (conversion ion yield) detection
- cobalt
- crystal analyzers
- energies of edges and emissions
- EXAFS
- combining techniques
- two‐color XAFS
- XAFS in fluorescence and transmission
- x‐ray scattering (diffraction)
- compositional analysis
- least squares analysis
- mapping procedures
- principal component analysis (PCA)
- single energy comparisons
- Compton scattering
- constant emission energy (CEE)
- constant incident energy (CIE)
- conversion electron/ion yield (CEY/CIY) detection
- copper
- catalyst
- crystal analyzers
- energy of absorption edge
- foil filter
- x‐ray emission energies
- x‐ray emission spectra
- copper oxides
- copper phthalocyanine
- cryogenic cooling see also freeze quench methods
- crystal analyzers
- cumulant expansion methods
d
- Darwin widths
- data analysis see also compositional analysis; structural analysis
- background subtraction
- websites
- Debye‐Waller factors
- Demeter (software)
- density functional theory (DFT)
- detection methods
- electron yield
- energy discriminating detectors
- fluorescence
- transmission
- x‐ray excited optical luminescence (XEOL)
- DFT see density functional theory (DFT)
- diamond
- Diamond (storage ring)
- bending magnet beamline
- bunch lengths
- helical undulator
- Microfocus Spectroscopy beamline
- STXM beamline
- transmission x‐ray microscope
- two‐color XAFS
- diffuse reflectance Fourier transform infrared spectroscopy (DRIFTS)
- diluents
- dipole (Laporte) allowed transitions
- double crystal monochromators
- drift diodes
- DRIFTS see diffuse reflectance Fourier transform infrared spectroscopy (DRIFTS)
e
- elastic (Rayleigh) scattering
- electron emission
- electron energy analyzers
- electron mean free path
- electron transitions
- electron yield detection
- energy discriminating detectors
- energy dispersive XAFS
- energy dispersive x‐ray emission spectrometers
- environmental materials
- ESRF (Grenoble)
- ethanol
- European XFEL
- EXAFS see extended x‐ray absorption fine structure (EXAFS)
- excitation energies and emission spectra
- experimental methods see also detection methods
- combining techniques
- effect of photon energies
- planning
- sample characteristics
- spatial resolution
- x‐ray free electron lasers (XFELs)
- extended x‐ray absorption fine structure (EXAFS)
- beamline architecture
- compositional analysis
- data analysis
- electron transitions
- information content
- interatomic distance
- photo‐electron wave model
- Quick EXAFS mode
- spectrum regions
- structural analysis
f
- FDMNES (software)
- FEFF (software)
- FELs see free electron lasers (FELs)
- Fermi energy
- ferromagnetic materials
- filters for fluorescence detection
- fluorescence detection methods see also resonant inelastic x‐ray scattering/spectroscopy (RIXS); x‐ray emission spectroscopy (XES)
- filters
- high‐resolution fluorescence detection (HERFD)
- ion chambers
- photodiode detectors
- sample orientation variation
- total fluorescence yield
- yield as function of atomic number
- yield available for detection
- focused‐beam microscopies
- scanning micro‐and nano‐focus microscopy
- scanning (transmission) x‐ray microscopy (STXM)
- Fourier transform method
- free electron lasers (FELs)
- laser‐pump measurements
- sampling environments
- XAS and XES
- x‐ray beam intensity
- freeze quench methods
- Fresnel zone plate (FZP)
- full field transmission x‐ray microscopy (TXM)
- functional materials
g
- gas‐solid reactions
- germanium
- absorption edges
- diodes
- energies of edges and emissions
- fluorescence attenuation lengths
- monochromator
- multiple ionizations
- photon energies for different Bragg angles
- GNXAS (software)
- gold
- graphite
h
- hard x‐ray photoelectron spectroscopy (HAXPES)
- harmonic rejection
- helical undulators
- helium, ion chamber gas
- HEPHAESTUS (software)
- heritage materials
- high harmonic generation
- high‐resolution fluorescence detection (HERFD)
- historical perspective
- Hund’s rules
- huntingtin gene
- hydrogenase
i
- indium antimonide
- inelastic (Compton) scattering
- inelastic x‐ray Raman scattering (XRS) see also resonant inelastic x‐ray scattering/spectroscopy (RIXS)
- information content
- inhomogeneous samples
- powdered materials
- textured materials
- insulating samples
- interatomic distance see also Debye‐Waller factors
- International X‐Ray Absorption Society
- ion chambers
- iridium
- absorption edges
- energies of edges and emissions
- zone plates
- iron
- crystal analyzers
- energies of edges and emissions
- fluorescence
- x‐ray transmission through
- iron oxide, magnetic dichroism
k
- Kirkpatrick‐Baez (KB) mirrors
- krypton
- energies of edges and emissions
- ion chamber gas
l
- laboratory x‐ray sources
- Laporte allowed transitions
- laser‐pump measurements
- Laue lenses
- Laue monchromators
- LCLS (Stanford, Calif.)
- lead
- least squares analysis
- linear absorption coefficient
- liquid phase reactions
- fast reactions
- steady state or slow reactions
- ultrafast reactions
- very fast reactions
- liquid solutions
- lithium ion cathodes
m
- magnetic dichroism
- magnetic domains
- magnetic materials
- manganese
- absorption edges
- crystal analyzers
- energies of edges and emissions
- photosystem II
- pigments
- mass absorption coefficients
- MCA (multichannel analyzers)
- metal‐to‐ligand charge transfer (MLCT)
- metamorphic materials
- Microfocus Spectroscopy beamline
- micro XANES
- micro x‐ray diffraction analysis (μXRD)
- Miller index
- mineral speciation
- MLCT (metal‐to‐ligand charge transfer)
- MLL (multilayer Laue lenses)
- molybdenum
- monochromators
- choice of crystals
- cryogenic cooling
- crystal planes and energy ratings
- double‐crystal
- focusing
- gratings
- harmonic rejection
- multilayer materials
- order‐sorting
- photon energies for different Bragg angles
- transmission (Laue) geometry
- muffin‐tin model
- multichannel analyzers (MCA)
- multilayer Laue lenses (MLL)
- multiple scattering
- multipole wigglers
o
- opto‐electronic materials
- ORCA (software)
- order‐sorting monochromator
- organic materials
- from historical shipwrecks
- manganese pigments
- wood from historical shipwrecks
p
- PCA (principal component analysis)
- phase‐contrast imaging
- photodiode detectors
- photoelectron(s)
- back scattering
- electron emission
- wave model
- photo‐excited states
- photon energies
- and crystal planes
- for different Bragg angles
- effect on experiment design
- and transmission through different materials
- pigment analysis
- pin diodes
- planar undulators
- plasma sources
- platinum
- absorption edges
- energies of edges and emissions
- platinum‐germanium catalyst
- polarization effects
- polyimide windows
- potassium
- powdered materials
- pre‐edge features
- circular dichroism
- in EXAFS
- in HERFD
- principal component analysis (PCA)
- pulsed mode
- PyMCA (software)
q
- quick extended x‐ray absorption fine structure (QEXAFS)
t
- textured materials
- time‐dependent density functional theory (TDDFT)
- titanium crystal analyzers
- total electron yield (TEY)
- total fluorescence yield (TFY)
- transmission methods
- transmission (Laue) monochromators
- transmission x‐ray microscopy (TXM) see also scanning transmission x‐ray microscopy (STXM)
- tungsten
- absorption edges
- energies of edges and emissions
- EXAFS effect
- two‐color XAFS
v
- valence to core (VtC) emissions
- vanadium crystal analyzers
- van Hamos geometry
- volatile samples
w
- water, x‐ray transmission through
- wave‐length shifter/wiggler
- websites, data analysis
- wood, from historical shipwrecks
z
- zeolite de‐alumination
- zinc
- crystal analyzers
- energies of edges and emissions
- fluorescence
- interatomic distance
- XMCD
- zinc oxide
- zone plates