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Index
Cover
Title Page
Copyright
Table of Contents
Preface
About the Companion Websites
Chapter 1: Why Surfaces and Interfaces of Electronic Materials
1.1 The Impact of Electronic Materials
1.2 Surface and Interface Importance as Electronics Shrink
1.3 Historical Background
1.4 Next Generation Electronics
1.5 Problems
References
Further Reading
Chapter 2: Semiconductor Electronic and Optical Properties
2.1 The Semiconductor Band Gap
2.2 The Fermi Level and Energy Band Parameters
2.3 Band Bending at Semiconductor Surfaces and Interfaces
2.4 Surfaces and Interfaces in Electronic Devices
2.5 Effects of Localized States: Traps, Dipoles, and Barriers
2.6 Summary
2.7 Problems
References
Further Reading
Chapter 3: Electrical Measurements of Surfaces and Interfaces
3.1 Sheet Resistance and Contact Resistivity
3.2 Contact Measurements: Schottky Barrier Overview
3.3 Heterojunction Band Offsets: Electrical Measurements
3.4 Summary
3.5 Problems
References
Further Reading
Chapter 4: Localized States at Surfaces and Interfaces
4.1 Interface State Models
4.2 Intrinsic Surface States
4.3 Extrinsic Surface States
4.4 The Solid State Interface: Changing Perspectives
4.5 Problems
References
Further Reading
Chapter 5: Ultrahigh Vacuum Technology
5.1 Ultrahigh Vacuum Chambers
5.2 Pumps
5.3 Manipulators
5.4 Gauges
5.5 Residual Gas Analysis
5.6 Deposition Sources
5.7 Deposition Monitors
5.8 Summary
5.9 Problems
References
Further Reading
Chapter 6: Surface and Interface Analysis
6.1 Surface and Interface Techniques
6.2 Excited Electron Spectroscopies
6.3 Principles of Surface Sensitivity
6.4 Multi-technique UHV Chambers
6.5 Summary
6.6 Problems
References
Further Reading
Chapter 7: Surface and Interface Spectroscopies
7.1 Photoemission Spectroscopy
7.2 Auger Electron Spectroscopy
7.3 Electron Energy Loss Spectroscopy
7.4 Rutherford Backscattering Spectrometry
7.5 Surface and Interface Technique Summary
7.6 Problems
References
Further Reading
Chapter 8: Dynamical Depth-Dependent Analysis and Imaging
8.1 Ion Beam-Induced Surface Ablation
8.2 Auger Electron Spectroscopy
8.3 X-Ray Photoemission Spectroscopy
8.4 Secondary Ion Mass Spectrometry
8.5 Spectroscopic Imaging
8.6 Depth-Resolved and Imaging Summary
8.7 Problems
References
Further Reading
Chapter 9: Electron Beam Diffraction and Microscopy of Atomic-Scale Geometrical Structure
9.1 Low Energy Electron Diffraction – Principles
9.2 Reflection High Energy Electron Diffraction
9.3 Scanning Electron Microscopy
9.4 Transmission Electron Microscopy
9.5 Electron Beam Diffraction and Microscopy Summary
9.6 Problems
References
Further Reading
Chapter 10: Scanning Probe Techniques
10.1 Atomic Force Microscopy
10.2 Scanning Tunneling Microscopy
10.3 Ballistic Electron Energy Microscopy
10.4 Atomic Positioning
10.5 Summary
10.6 Problems
References
Further Reading
Chapter 11: Optical Spectroscopies
11.1 Overview
11.2 Optical Absorption
11.3 Modulation Techniques
11.4 Multiple Surface Interaction Techniques
11.5 Spectroscopic Ellipsometry
11.6 Surface Enhanced Raman Spectroscopy
11.7 Surface Photoconductivity
11.8 Surface Photovoltage Spectroscopy
11.9 Photoluminescence Spectroscopy
11.10 Cathodoluminescence Spectroscopy
11.11 Summary
11.12 Problems
References
Further Reading
Chapter 12: Electronic Material Surfaces
12.1 Geometric Structure
12.2 Chemical Structure
12.3 Electronic Structure
12.4 Summary
12.5 Problems
References
Further Reading
Chapter 13: Surface Electronic Applications
13.1 Charge Transfer and Band Bending
13.2 Oxide Gas Sensors
13.3 Granular Gas Sensors
13.4 Nanowire Sensors
13.5 Chemical and Biosensors
13.6 Surface Electronic Temperature, Pressure, and Mass Sensors
13.7 Summary
13.8 Problems
References
Further Reading
Chapter 14: Semiconductor Heterojunctions
14.1 Geometrical Structure
14.2 Chemical Structure
14.3 Electronic Structure
14.4 Conclusions
14.5 Problems
References
Further Reading
Chapter 15: Metal–Semiconductor Interfaces
15.1 Overview
15.2 Metal–Semiconductor Interface Dipoles
15.3 Interface States
15.4 Self-Consistent Electrostatic Calculations
15.5 Experimental Schottky Barriers
15.6 Interface Barrier Height Engineering
15.7 Atomic-Scale Control
15.8 Summary
15.9 Problems
References
Further Reading
Chapter 16: Next Generation Surfaces and Interfaces
16.1 Current Status
16.2 Current Device Challenges
16.3 Emerging Directions
16.4 The Essential Guide Conclusions
Appendix A: Glossary of Commonly Used Symbols
Appendix B: Table of Acronyms
Appendix C: Table of Physical Constants and Conversion Factors
Appendix D: Semiconductor Properties
Index
End User License Agreement
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