Measurement and Instrumentation in Engineering by Tse, Francis S. -- Read -- Imperial Library of Trantor

Index

Cover Half Title Title Page Copyright Page Dedication Table of Contents Preface 1. THE PLACE OF MEASUREMENT, INSTRUMENTATION, AND LABORATORY

1-1. Introduction 1-2. Significance of Measurement and Instrumentation 1-3. Measuring Systems

A. The Transducer and Its Environment: An Overview B. The Nature of Measurement: A Design Problem C. Functional Stages of Measuring Systems D. The Sensing Process E. Examples of Typical Sensors

1-4. The Measurement Problem

A. Valid Measurements B. Measuring Systems

1-5. The Instrumentation Problem 1-6. The Laboratory Problem

A. Experimentation B. Goals and Implementation C. Laboratory Exercises

1-7. Reports 1-8. Nomenclature 1-9. Units and Standards

A. Units B. Standards

Problems References

2. TRANSDUCERS

2-1. Physical Laws

A. First-Order Effects: Signal/Noise Ratio B. Second-Order and Irreversible Effects

2.2. Static Characteristics

A. Obtaining a Static Characteristic Curve B. Linear Characteristics C. Common Nonlinearities D. Effects of Nonlinearities E. Linearization

2-3. Transducer Types and Modeling

A. Information Models B. Energy Models C. Incremental Models

2-4. Calibration 2-5. Errors in Measurements

A. Accuracy, Precision, Uncertainty, Mistakes B. Systematic and Random Errors C. Engineering Data

2-6. Uncertainty Analysis

A. Overall Uncertainty B. Estimation for Design C. Selection of Alternative Test Methods

Problems References Suggested Readings

3. STRUCTURE OF MEASURING SYSTEMS

3-1. Methods of Measurement

A. Null-Balance Method B. Unbalance Method C. Differential Method D. Inferential and Comparative Measurements

3-2. Comparison of Methods of Measurement 3-3. Interaction Between Components

A. Concept of Impedance B. One-Port Devices C. Two-Port Devices D. Three-Port Devices: Amplifiers

3-4. Bridge Circuits

A. Null Balance Systems B. Unbalance and Differential Systems

3-5. Basic Transducer Circuits

A. Ideal Power Sources B. Nonideal Power Sources

3-6. Systems with Feedback

A. System Description B. Effects on Characteristics of Components C. Effects on System Performance

3-7. Methods of Noise Reduction

A. Noise Reduction at the Interface B. Noise Reduction by Insensitivity

3-8. Noise Documentation Problems References

4. DYNAMIC CHARACTERISTICS OF INSTRUMENTS

4-1. Introduction 4-2. Modeling 4-3. Time Response of Instruments

A. Test Signals B. Zero-Order Instruments C. First-Order Instruments D. Second-Order Instruments

4-4. Analog Data: Errors and Corrections

A. Requirements for Adequate Response B. Dynamic Errors C. Corrections for Analog Data

4-5. Limitations of Time-Domain Analysis 4-6. Frequency Response of Instruments

A. Elementary Transfer Functions B. Bode Plots of General Transfer Functions C. Dynamic Compensation

4-7. Response to Periodic Signals

A. Fourier Spectrum B. Response to Periodic Signals

4-8. Response to Transient Signals

A. Frequency Contents of Transients B. Response to Transient Signals C. Transient Test Signals Problems

References Suggested Readings

5. NONSELF-GENERATING TRANSDUCERS AND APPLICATIONS

5-1. Introduction 5-2. Differential Transformers 5-3. Differential Transformers: Applications 5-4. Carrier Systems

A. Amplitude Modulation: Sine-Wave Carrier B. Types of Carriers

5-5. Inductive Transducers 5-6. Inductive Transducers: Applications 5-7. Strain Gages

A. Biaxial Stresses B. Gage Selection C. Strain Gage Circuits

5-8. Strain Gages: Applications 5-9. Capacitive Transducers 5-10. Capacitive Transducers: Applications Problems References Suggested Readings

6. SIGNAL CONDITIONING AND OUTPUT DEVICES

6-1. Introduction 6-2. Operational Amplifiers: Characteristics 6-3. Operational Amplifiers: Basic Circuits 6-4. Op-Amp Amplifiers and Applications

A. Amplifiers B. Applications

6-5. Binary Numbering System 6-6. Digital Techniques

A. Logic Gates B. Boolean Algebra C. Flip-Flops

6-7. Functional Logic Circuits

A. Encoders-Decoders B. Multiplexers-Demultiplexers C. Sample-and-Hold D. Counters E. Analog/Digital Converters

6-8. Output Devices

A. Cathode-Ray Oscilloscopes B. Digital Electronic Counters C. Magnetic Tape and Disk Recorders D. Strip-Chart Recorders and X-Y Plotters E. Stroboscopes

6-9. Output/Storage Devices

A. Digital Storage Oscilloscopes B. Digital Signal Analyzers C. Fast Fourier Transform D. Sampling E. Data Acquisition Systems

Problems References

7. DISPLACEMENT, MOTION, FORCE, TORQUE, AND PRESSURE MEASUREMENTS

7-1. Introduction 7-2. Dimension and Displacement Measurements

A. Gage Blocks: The Working Standard B. Examples: Mechanical Methods C. Examples: Other Methods

7-3. Motion Measurements 7-4. Velocity Measurements 7-5. Acceleration Measurements

A. Seismic Instruments B. Accelerometers C. Equivalent Circuits D. Environmental Effects E. Calibration

7-6. Force Measurements

A. Dynamic Force Measurements B. Transient Calibration of Force Transducers and Accelerometers

7-7. Torque Measurements 7-8. Pressure Measurements

A. Sensing Elements B. Applications C. Installations D. Calibrations

Problems References

8. FLUID-FLOW MEASUREMENTS

8-1. Introduction 8-2. Laminar and Turbulent Flow 8-3. “Direct” Flow Measurements

A. Weighing and Volumetric Methods B. Positive-Displacement Meters C. Flow Visualization D. “Carrier” Systems

8-4. “Indirect” Flow Measurements 8-5. Square-Root-Law Flowmeters

A. Orifice and Venturi Flowmeters B. Characteristics of Square-Root-Law Flowmeters C. Pitot-Static Tubes D. Variable-Area Flowmeters E. Drag-Force Flowmeters

8-6. Turbine Flowmeters 8-7. Vortex-Shedding Flowmeters 8-8. Hot-Wire and Hot-Film Anemometers

A. Constant-Temperature Anemometers B. Constant-Current Anemometers

8-9. Mass Flowmeters

A. Density Measurements B. Direct Mass Flowmeters

Problems References

9. TEMPERATURE MEASUREMENTS

9-1. Introduction 9-2. International Practical Temperature Scale 9-3. Expansion and Filled Thermometers 9-4. Thermocouples

A. Thermoelectric Effects B. Thermoelectric Laws C. Gradient Approach to Thermocouple Circuitry D. Reference Junctions E. Thermocouple Probes F. Practical Thermocouple Measurements

9-5. Resistance Temperature Detectors

A. Materials and Construction B. Characteristics and Standards C. Circuits D. Sources of Error

9-6. Thermistors 9-7. Pyrometers: Principles

A. Physical Laws B. Emittance C. Measurement Uncertainty

9-8. Pyrometers

A. Brightness Pyrometers B. Wideband and Selected-Band Pyrometers C. Components

9-9. Miscellaneous Temperature Sensors Problems References

10. LABORATORY EXPERIMENTS

10-1. Introduction 10-2. Experiment 1. Voltage Measurements: Oscilloscopes, Multimeters, and Digital Multimeters

E1-1. Objectives E1-2. Introduction E1-3. Description of Equipment E1-4. Voltage Measurements: Experiment 1-1 E1-5. Input/Output Impedances: Experiment 1-2 E1-6. Loading in Measurements: Experiment 1-3 E1-7. AC/DC Input Coupling: Experiment 1-4 E1-8. Measurement of C in the AC Couple: Experiment 1-5 E1-9. Trigger System of Oscilloscopes: Experiment 1-6 E1-10. Probe Compensation: Experiment 1-7 E1-11. Miscellaneous Controls: Experiment 1-8

10-3. Experiment 2. Transducers and Physical Laws

E2-1. Introduction E2-2. Equipment E2-3. Resistive Transducers E2-4. Capacitive Transducers E2-5. Inductive Transducers E2-6. Other Common Transducers

10-4. Experiment 3. Measuring Systems

E3-1. Introduction E3-2. Acoustic Pressure Detection E3-3. Vibration of a Simple Beam

10-5. Experiment 4. Strain Gage Applications

E4-1. Objectives E4-2. Introduction E4-3. Stress-Strain Relations: A Review E4-4. Strain Gages and Gage Circuits E4-5. Flexures and Cross-Sensitivity E4-6. Equipment E4-7. Laboratory Experiments E4-8. Pressure Transducer Calibration: Experiment 4-1 E4-9. Direct and Indirect Calibrations: Experiment 4-2 E4-10. Simply Supported Beam: Experiment 4-3 E4-11. Tensile Test: Experiment 4-4 E4-12. Compression Test: Experiment 4-5 E4-13. Cross-Sensitivity: Experiment 4-6 E4-14. Torsion and Bending: Experiment 4-7 E4-15. Long Thin-Walled Cylinder: Experiment 4-8 E4-16. Biaxial Strain Measurements: Experiment 4-9

10-6. Experiment 5. Time Response of Instruments

E5-1. Introduction E5-2. The Model E5-3. Demonstration of Zero-Order Instruments E5-4. Demonstration of First-Order Instruments E5-5. First-Order Instruments E5-6. Demonstration of Second-Order Instruments E5-7. Second-Order Systems: Experiment 5-3

10-7. Experiment 6. Frequency Response of Instruments

E6-1. Frequency Response Method E6-2. Demonstration of Zero-Order Instruments E6-3. First-Order Instruments E6-4. Second-Order Instruments

10-8. Experiment 7. Signal Conditioning

E7-1. Introduction E7-2. Demonstration of Thermocouple Compensation E7-3. Demonstration of Carrier Systems E7-4. Demonstration of Amplitude Modulation and Demodulation E7-5. Characteristics of Filters E7-6. Operational Amplifiers

Appendix A: Review of Electrical Networks Appendix B: Linear Ordinary Differential Equations with Constant Coefficients Appendix C: Fourier Transforms Index

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